Specifications:
Display:
- Screen Size: 2.4-inch TFT color screen
- Backlight: LED
Power Supply:
- Battery: Rechargeable lithium
- Charging Interface: USB Type-C, 5V
Dimensions:
- Size: 79 x 103 x 31 mm
- Stand: Foldable and integrated
Digital Oscilloscope:
- Sample Rate: 10MSa/s
- Bandwidth: 500kHz
- Input Resistance: 1MΩ
- Coupling: AC/DC
- Voltage Range: 400V max
- Vertical Sensitivity: 10mV-10V
- Horizontal Time Base: 1μs to 10s
- Trigger Modes: Auto, Normal, Single
- Trigger Types: Rising/Falling edge
- Waveform Freeze: Yes
- Automatic Measurements: Yes
Signal Generator:
- Sine Wave: 1-100kHz, 0-3.3V, 50% duty cycle
- Square Wave: 1-100kHz, 3.3V, 50% duty cycle
- Pulse Wave: 1-100kHz, 3.3V, 0-100% duty cycle
- Triangle Wave: 1-100kHz, 0-3.3V, 50% duty cycle
- Ramp: 1-100kHz, 0-3.3V, 0-100% duty cycle
- DC: 0-3.3V
Transistor Tester & Additional Tools:
- Transistor Test: NPN, PNP, MOSFET, IGBT
- Diode Testing: Forward voltage drop <4.5V
- Zener Diode Testing: 0.01-32V
- Capacitor Range: 25pF-100mF
- Resistor Range: 0.01Ω-50MΩ
- Inductance Range: 10μH-1000μH
- Battery Voltage Testing: 0.1-4.5V
- Temperature Sensor Support: DS18B20 (0-85°C), DHT11 (0-60°C/5-95%)
Package:
- 1x FNIRSI DSO-TC3 3-IN-1 Handheld Digital Oscilloscope Signal Generator Transistor Tester
Description:
The FNIRSI DSO-TC3 is a versatile, handheld device that functions as a digital oscilloscope, component tester, and signal generator. With a rechargeable battery and compact design, it's easy to carry and use in various testing environments. This oscilloscope is ideal for those who need a multifunctional tool for electronics projects and component testing.
FAQ:
-
Can the FNIRSI DSO-TC3 test both transistors and diodes?
Yes, it can test NPN, PNP transistors, FETs, diodes, and other components in-circuit.
-
What waveforms can the signal generator produce?
The device generates sine, square, pulse, triangle, ramp, and DC waveforms.
-
Is it suitable for fieldwork?
Yes, it is portable and features a rechargeable battery, making it ideal for on-the-go testing.
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